Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis. (August 2019)

Record Type:
Journal Article
Title:
Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis. (August 2019)
Main Title:
Quantitative Characterization of Misfit Dislocations at GaP/Si Heteroepitaxial Interfaces via Electron Channeling Contrast Imaging and Semi-Automated Image Analysis
Authors:
Blumer, Ari N.
Boyer, Jacob T.
Deitz, Julia I.
Rodriguez, Francisco A.
Grassman, Tyler J.
Abstract:
Is Part Of:
Microscopy and microanalysis. Volume 25:(2022)Supplement 2
Journal:
Microscopy and microanalysis
Issue:
Volume 25:(2022)Supplement 2
Issue Display:
Volume 25, Issue 2 (2019)
Year:
2019
Volume:
25
Issue:
2
Issue Sort Value:
2019-0025-0002-0000
Page Start:
202
Page End:
203
Publication Date:
2019-08
Subjects:
Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82
Journal URLs:
https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗
DOI:
10.1017/S1431927619001740 ↗
Languages:
English
ISSNs:
1431-9276
Deposit Type:
Legaldeposit
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD Digital store
Ingest File:
20026.xml