Cite
MLA Citation
P. Specht et al.. “Low Dose-Rate High-Resolution Transmission Electron Microscopy of Group III – Nitride Electronic Device Structures Using a Direct Electron Detector.” Microscopy and microanalysis, vol. 25, n.d., pp. 1714–1715. http://access.bl.uk/ark:/81055/vdc_100145642800.0x000015