Cite
APA Citation
Specht, P., Kirste, R., Sitar, Z., & Kisielowski, C. (n.d.). low Dose-Rate High-Resolution Transmission Electron Microscopy of Group III – Nitride Electronic Device Structures Using a Direct Electron Detector. Microscopy and microanalysis, 25, 1714–1715. http://access.bl.uk/ark:/81055/vdc_100145642800.0x000015