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MLA Citation
T. Phulpin et al.. “Failure analysis of ESD-stressed SiC MESFET.” Microelectronics and reliability, vol. 55, no. 9, 2015, pp. 1542–1548. http://access.bl.uk/ark:/81055/vdc_100051208996.0x00005a
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T. Phulpin et al.. “Failure analysis of ESD-stressed SiC MESFET.” Microelectronics and reliability, vol. 55, no. 9, 2015, pp. 1542–1548. http://access.bl.uk/ark:/81055/vdc_100051208996.0x00005a