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HARVARD Citation
Phulpin, T. et al. (2015). Failure analysis of ESD-stressed SiC MESFET. Microelectronics and reliability. 55 (9), pp. 1542-1548. [Online].
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Phulpin, T. et al. (2015). Failure analysis of ESD-stressed SiC MESFET. Microelectronics and reliability. 55 (9), pp. 1542-1548. [Online].