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APA Citation
Gaur, A., Chiappe, D., Lin, D., Cott, D., Asselberghs, I., Heyns, M., & Radu, I. (2019). analysis of admittance measurements of MOS capacitors on CVD grown bilayer MoS2. 2D materials, 6, . http://access.bl.uk/ark:/81055/vdc_100087540733.0x00000b