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APA Citation
Huang, W., Chen, P., Lin, C., Zheng, H., Chen, H., Ciou, F., Tan, Y., Chang, K., Lin, Y., Chang, Y., Lin, S., Hung, W., Thio, W., & Chang, T. (2021). abnormal hump in low temperature in SiGe devices with silicon capping insertion layer. Journal of physics, 54, . http://access.bl.uk/ark:/81055/vdc_100137795762.0x00005e