Cite
MLA Citation
C. Robin et al.. “Reliability evaluation of a 0.25 μm SiGe technology for space applications.” Microelectronics and reliability, vol. 100, 2019, p. . http://access.bl.uk/ark:/81055/vdc_100098443109.0x00005b
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C. Robin et al.. “Reliability evaluation of a 0.25 μm SiGe technology for space applications.” Microelectronics and reliability, vol. 100, 2019, p. . http://access.bl.uk/ark:/81055/vdc_100098443109.0x00005b