Reliability evaluation of a 0.25 μm SiGe technology for space applications. (September 2019)

• Record Type: Journal Article
• Authors: Robin, C.; Rochette, S.; Desgrez, S.; Muraro, J.L.; Langrez, D.; Roux, J.L.; Krstic, M.
• Is Part Of: Microelectronics and reliability. Volume 100/101(2019)
• Publication Date: 2019-09
• Subjects: SiGe -- Reliability -- RFIC -- Space -- End user -- Methodology; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2019.113480
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: This article presents a reliability evaluation of the SiGe SGB25 technology from the European foundry IHP. We propose in this paper a methodology allowing to take into account reliability space requirements. For that, specific test vehicles have been designed and dedicated test sequences have been defined. The final goal is to define a MMIC (Monolithic Microwave Integrated Circuit) safe operating area in terms of static and dynamic electrical constraints. Emphasis will be given to the influence of the degradation modes on noise parameters.