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APA Citation
Ioannidis, E., Theodorou, C., Haendler, S., Dimitriadis, C., & Ghibaudo, G. (2014). impact of low‐frequency noise variability on statistical parameter extraction in ultra‐scaled CMOS devices. Electronics letters, 50(19), 1393–1395. http://access.bl.uk/ark:/81055/vdc_100126834776.0x00004d