Cite
HARVARD Citation
Ioannidis, E. et al. (2014). Impact of low‐frequency noise variability on statistical parameter extraction in ultra‐scaled CMOS devices. Electronics letters. 50 (19), pp. 1393-1395. [Online].
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Ioannidis, E. et al. (2014). Impact of low‐frequency noise variability on statistical parameter extraction in ultra‐scaled CMOS devices. Electronics letters. 50 (19), pp. 1393-1395. [Online].