Cite
MLA Citation
Jay Pathak and Anand Darji. “Assessment of interface traps in In0.53Ga0.47As FinFET with gate‐to‐source/drain underlap for sub‐14 nm technology node to impede short channel effect.” IET circuits, devices & systems, vol. 13, no. 4, 2019, pp. 428–434. http://access.bl.uk/ark:/81055/vdc_100124831589.0x00002c