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APA Citation
Pathak, J., & Darji, A. (2019). assessment of interface traps in In0.53Ga0.47As FinFET with gate‐to‐source/drain underlap for sub‐14 nm technology node to impede short channel effect. IET circuits, devices & systems, 13(4), 428–434. http://access.bl.uk/ark:/81055/vdc_100124831589.0x00002c