Cite
APA Citation
Peters, J. A., Liu, Z., Im, J., Nguyen, S., Sebastian, M., Freeman, A. J., Kanatzidis, M. G., & Wessels, B. W. (2015). characterization of deep level defects in Tl6I4S single crystals by photo-induced current transient spectroscopy. Journal of physics, 48, . http://access.bl.uk/ark:/81055/vdc_100049367997.0x000001