Cite
MLA Citation
Xi Shi et al.. “Fracture and electric‐field‐induced crack growth behavior in NBT‐6BT relaxor ferroelectrics.” Journal of the American Ceramic Society, vol. 104, no. 5, 2021, pp. 2158–2169. http://access.bl.uk/ark:/81055/vdc_100123369245.0x000064