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APA Citation
Shi, X., Kumar, N., Jones, J. L., & Hoffman, M. (2021). fracture and electric‐field‐induced crack growth behavior in NBT‐6BT relaxor ferroelectrics. Journal of the American Ceramic Society, 104(5), 2158–2169. http://access.bl.uk/ark:/81055/vdc_100123369245.0x000064