Cite
HARVARD Citation
Shi, X. et al. (2021). Fracture and electric‐field‐induced crack growth behavior in NBT‐6BT relaxor ferroelectrics. Journal of the American Ceramic Society. 104 (5), pp. 2158-2169. [Online].
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Shi, X. et al. (2021). Fracture and electric‐field‐induced crack growth behavior in NBT‐6BT relaxor ferroelectrics. Journal of the American Ceramic Society. 104 (5), pp. 2158-2169. [Online].