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APA Citation
Major, G. H., Chapman, S. C., Chapman, J. T., Wheeler, J. I., Chatterjee, S., Cushman, C. V., Ess, D. H., & Linford, M. R. (2021). spectroscopic ellipsometry of SU‐8 photoresist from 190 to 1680 nm (0.740–6.50 eV). Surface and interface analysis, 53, 5–13. http://access.bl.uk/ark:/81055/vdc_100115156417.0x000053