Cite
HARVARD Citation
Major, G. et al. (2021). Spectroscopic ellipsometry of SU‐8 photoresist from 190 to 1680 nm (0.740–6.50 eV). Surface and interface analysis. pp. 5-13. [Online].
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Major, G. et al. (2021). Spectroscopic ellipsometry of SU‐8 photoresist from 190 to 1680 nm (0.740–6.50 eV). Surface and interface analysis. pp. 5-13. [Online].