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APA Citation
Ahmed, M., Arai, Y., Glab, S., Idzik, M., Kapusta, P., Miyoshi, T., Takeda, A., & Turala, M. (n.d.). characterization of high resolution CMOS monolithic active pixel detector in SOI technology. Journal of instrumentation, 10, P05010. http://access.bl.uk/ark:/81055/vdc_100115863404.0x00004f