Characterization of high resolution CMOS monolithic active pixel detector in SOI technology. (18th May 2015)

Record Type:: Journal Article
Title:: Characterization of high resolution CMOS monolithic active pixel detector in SOI technology. (18th May 2015)
Main Title:: Characterization of high resolution CMOS monolithic active pixel detector in SOI technology
Authors:: Ahmed, M.I.
Arai, Y.
Glab, S.
Idzik, M.
Kapusta, P.
Miyoshi, T.
Takeda, A.
Turala, M.
Abstract:
Is Part Of:: Journal of instrumentation. Volume 10:Number 5(2015:May)
Journal:: Journal of instrumentation
Issue:: Volume 10:Number 5(2015:May)
Issue Display:: Volume 10, Issue 5 (2015)
Year:: 2015
Volume:: 10
Issue:: 5
Issue Sort Value:: 2015-0010-0005-0000
Page Start:: P05010
Page End:: P05010
Publication Date:: 2015-05-18
Subjects:: Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/10/05/P05010 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 14979.xml