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APA Citation
Fan, S. S., Hsu, C., Jen, C., Chen, K., & Juan, L. (2020). corrigendum to "Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes" [Adv. Eng. Informat. 46 (2020) 101166]. Advanced engineering informatics, 46, . http://access.bl.uk/ark:/81055/vdc_100115296681.0x000011