Corrigendum to "Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes" [Adv. Eng. Informat. 46 (2020) 101166]. (October 2020)

Record Type:
Journal Article
Title:
Corrigendum to "Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes" [Adv. Eng. Informat. 46 (2020) 101166]. (October 2020)
Main Title:
Corrigendum to "Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes" [Adv. Eng. Informat. 46 (2020) 101166]
Authors:
Fan, Shu-Kai S.
Hsu, Chia-Yu
Jen, Chih-Hung
Chen, Kuan-Lung
Juan, Li-Ting
Abstract:
Is Part Of:
Advanced engineering informatics. Volume 46(2020)
Journal:
Advanced engineering informatics
Issue:
Volume 46(2020)
Issue Display:
Volume 46, Issue 2020 (2020)
Year:
2020
Volume:
46
Issue:
2020
Issue Sort Value:
2020-0046-2020-0000
Page Start:
Page End:
Publication Date:
2020-10
Subjects:
Computer-aided engineering -- Periodicals
Engineering -- Data processing -- Periodicals
620.00285
Journal URLs:
http://www.sciencedirect.com/science/journal/14740346 ↗
http://books.google.com/books?id=KhFVAAAAMAAJ ↗
http://www.elsevier.com/journals ↗
DOI:
10.1016/j.aei.2020.101178 ↗
Languages:
English
ISSNs:
1474-0346
Deposit Type:
Legaldeposit
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library DSC - 0696.851100
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Ingest File:
14935.xml