Cite
HARVARD Citation
Das, P. et al. (2020). High broadband photoconductivity of few-layered MoS2 field-effect transistors measured using multi-terminal methods: effects of contact resistance. Nanoscale. 12 (45), pp. 22904-22916. [Online].
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Das, P. et al. (2020). High broadband photoconductivity of few-layered MoS2 field-effect transistors measured using multi-terminal methods: effects of contact resistance. Nanoscale. 12 (45), pp. 22904-22916. [Online].