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APA Citation
Das, P., Nash, J., Webb, M., Burns, R., Mapara, V. N., Ghimire, G., Rosenmann, D., Divan, R., Karaiskaj, D., McGill, S. A., Sumant, A. V., Dai, Q., Ray, P. C., Tawade, B., Raghavan, D., Karim, A., & Pradhan, N. R. (2020). high broadband photoconductivity of few-layered MoS2 field-effect transistors measured using multi-terminal methods: effects of contact resistance. Nanoscale, 12(45), 22904–22916. http://access.bl.uk/ark:/81055/vdc_100114914165.0x000051