Cite
MLA Citation
Y.Q. Aguiar et al.. “Reliability-driven pin assignment optimization to improve in-orbit soft-error rate.” Microelectronics and reliability, vol. 114, 2020, p. . http://access.bl.uk/ark:/81055/vdc_100114884824.0x000054
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Y.Q. Aguiar et al.. “Reliability-driven pin assignment optimization to improve in-orbit soft-error rate.” Microelectronics and reliability, vol. 114, 2020, p. . http://access.bl.uk/ark:/81055/vdc_100114884824.0x000054