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APA Citation
Aguiar, Y., Wrobel, F., Autran, J., Leroux, P., Saigné, F., Pouget, V., & Touboul, A. (2020). reliability-driven pin assignment optimization to improve in-orbit soft-error rate. Microelectronics and reliability, 114, . http://access.bl.uk/ark:/81055/vdc_100114884824.0x000054