Cite
HARVARD Citation
Aguiar, Y. et al. (2020). Reliability-driven pin assignment optimization to improve in-orbit soft-error rate. Microelectronics and reliability. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Aguiar, Y. et al. (2020). Reliability-driven pin assignment optimization to improve in-orbit soft-error rate. Microelectronics and reliability. p. . [Online].