Cite
APA Citation
Pang, Z., Si, X., Hu, C., Zhang, J., & Pei, H. (2020). retraction notice to "A review on modeling and analysis of accelerated degradation data for reliability assessment" [Microelectron. Reliab. 107 April (2020) 113602]. Microelectronics and reliability, 107, . http://access.bl.uk/ark:/81055/vdc_100113738912.0x000055