Retraction notice to "A review on modeling and analysis of accelerated degradation data for reliability assessment" [Microelectron. Reliab. 107 April (2020) 113602]. (April 2020)

Record Type:: Journal Article
Title:: Retraction notice to "A review on modeling and analysis of accelerated degradation data for reliability assessment" [Microelectron. Reliab. 107 April (2020) 113602]. (April 2020)
Main Title:: Retraction notice to "A review on modeling and analysis of accelerated degradation data for reliability assessment" [Microelectron. Reliab. 107 April (2020) 113602]
Authors:: Pang, Zhenan
Si, XiaoSheng
Hu, Changhua
Zhang, Jianxun
Pei, Hong
Abstract:
Is Part Of:: Microelectronics and reliability. Volume 107(2020)
Journal:: Microelectronics and reliability
Issue:: Volume 107(2020)
Issue Display:: Volume 107, Issue 2020 (2020)
Year:: 2020
Volume:: 107
Issue:: 2020
Issue Sort Value:: 2020-0107-2020-0000
Page Start:
Page End:
Publication Date:: 2020-04
Subjects:: Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815
Journal URLs:: http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗
DOI:: 10.1016/j.microrel.2020.113960 ↗
Languages:: English
ISSNs:: 0026-2714
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 14777.xml