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HARVARD Citation
Böttcher, A. et al. (2020). Nanoscale patterning at the Si/SiO2/graphene interface by focused He+ beam. Nanotechnology. p. . [Online].
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Böttcher, A. et al. (2020). Nanoscale patterning at the Si/SiO2/graphene interface by focused He+ beam. Nanotechnology. p. . [Online].