1. "Limiting power cycling stress in power MOSFETs by active thermal control". (August 2020) Authors: Magnone, Paolo; Abedini, Hossein; Petucco, Andrea Journal: Microelectronics and reliability Issue: Volume 111(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. 0.5 μm GaN RF power bar technology space evaluation. (November 2020) Authors: Van de Casteele, J.; Stuhldreier, H.; Bouw, D.; Gourdon, C.; Raoult, M.; Durand, E.; Van Den Berghe, S.; Hollmer, M.; Grunwald, M.; Lambert, B.; Blanck, H.; Barnes, A. Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. 1 GHz Low-Noise Hybrid Preamplifier for Optical Detection. (1980) Authors: Monti, O.; Scavennec, A.; le Men, P. Journal: Electrocomponent science and technology Issue: Volume 6:Number 3/4(1979) Page Start: 189 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. 1.8 GHz Lumped Component Thick Film Amplifier. (1974) Authors: Allen, C. P.; Tucker, C. E.; Woodcock, K. W.; Barnwell, P. G. Journal: Electrocomponent science and technology Issue: Volume 1:Number 2(1974) Page Start: 141 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. 1200V 4H-SiC trench MOSFET with superior figure of merit and suppressed quasi-saturation effect. (August 2021) Authors: Fu, Hao; Wei, Zhaoxiang; Liu, Siyang; Wei, Jiaxing; Xu, Hang; Ni, Lihua; Yang, Zhuo; Sun, Weifeng Journal: Microelectronics and reliability Issue: Volume 123(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. 16-Channel micro magnetic flux sensor array for IGBT current distribution measurement. Issue 9 (August 2015) Authors: Tomonaga, H.; Tsukuda, M.; Okoda, S.; Noda, R.; Tashiro, K.; Omura, I. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1357 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. 1978 International Microelectronics Symposium: List of Papers and Abstracts. (1979) Journal: Electrocomponent science and technology Issue: Volume 5:Number 4(1978) Page Start: 227 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. 1978 International Microelectronics Symposium: List of Papers and Abstracts. (1979) Journal: Electrocomponent science and technology Issue: Volume 5:Number 4(1978) Page Start: 227 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. 1979 International Microelectronics Symposium: Abstracts. (1980) Journal: Electrocomponent science and technology Issue: Volume 7:Number 1/3(1980) Page Start: 187 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. 1979 International Microelectronics Symposium: List of Papers and Abstracts. (1980) Journal: Electrocomponent science and technology Issue: Volume 6:Number 2(1979) Page Start: 97 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗