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APA Citation
Geng, W., Tian, X., Jiang, Y., Zhu, Y., Tang, Y., Wang, Y., Zou, M., Feng, Y., Wu, B., Hu, W., & Ma, X. (2020). unveiling the pinning behavior of charged domain walls in BiFeO3 thin films via vacancy defects. Acta materialia, 186, 68–76. http://access.bl.uk/ark:/81055/vdc_100104359379.0x000014