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APA Citation
Liu, I., & Fernández, D. (2020). discussion on "Assessing the goodness of fit of logistic regression models in large samples: A modification of the Hosmer‐Lemeshow test" by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow. Biometrics, 76(2), 564–568. http://access.bl.uk/ark:/81055/vdc_100102660845.0x00005d