Discussion on "Assessing the goodness of fit of logistic regression models in large samples: A modification of the Hosmer‐Lemeshow test" by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow. Issue 2 (6th April 2020)

Record Type:
Journal Article
Title:
Discussion on "Assessing the goodness of fit of logistic regression models in large samples: A modification of the Hosmer‐Lemeshow test" by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow. Issue 2 (6th April 2020)
Main Title:
Discussion on "Assessing the goodness of fit of logistic regression models in large samples: A modification of the Hosmer‐Lemeshow test" by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow
Authors:
Liu, Ivy
Fernández, Daniel
Abstract:
Is Part Of:
Biometrics. Volume 76:Issue 2(2020)
Journal:
Biometrics
Issue:
Volume 76:Issue 2(2020)
Issue Display:
Volume 76, Issue 2 (2020)
Year:
2020
Volume:
76
Issue:
2
Issue Sort Value:
2020-0076-0002-0000
Page Start:
564
Page End:
568
Publication Date:
2020-04-06
Subjects:
Biometry -- Periodicals
570.15195
Journal URLs:
http://onlinelibrary.wiley.com/ ↗
DOI:
10.1111/biom.13251 ↗
Languages:
English
ISSNs:
0006-341X
Deposit Type:
Legaldeposit
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library DSC - 2088.000000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:
13154.xml