Cite
HARVARD Citation
Buffolo, M. et al. (2018). Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits. Microelectronics and reliability. pp. 855-858. [Online].
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Buffolo, M. et al. (2018). Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits. Microelectronics and reliability. pp. 855-858. [Online].