Cite
MLA Citation
Xiaonan Shi et al.. “Atomic force microscopy - Scanning electrochemical microscopy (AFM-SECM) for nanoscale topographical and electrochemical characterization: Principles, applications and perspectives.” Electrochimica acta, vol. 332, 2020, p. . http://access.bl.uk/ark:/81055/vdc_100098805465.0x000059