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APA Citation
Shi, X., Qing, W., Marhaba, T., & Zhang, W. (2020). atomic force microscopy - Scanning electrochemical microscopy (AFM-SECM) for nanoscale topographical and electrochemical characterization: Principles, applications and perspectives. Electrochimica acta, 332, . http://access.bl.uk/ark:/81055/vdc_100098805465.0x000059