Cite
MLA Citation
Alexander Devin Giddings et al.. “Industrial application of atom probe tomography to semiconductor devices.” Scripta materialia, 2018, pp. 82–90. http://access.bl.uk/ark:/81055/vdc_100057095431.0x00000b
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Alexander Devin Giddings et al.. “Industrial application of atom probe tomography to semiconductor devices.” Scripta materialia, 2018, pp. 82–90. http://access.bl.uk/ark:/81055/vdc_100057095431.0x00000b