Cite
APA Citation
Hashiguchi, H., Sagawa, R., Okunishi, E., Endo, N., & Kondo, Y. (n.d.). 3aA_MI-7Atomic Resolution Imaging and Analysis of 2D-materials at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun. Microscopy, 67, i28. http://access.bl.uk/ark:/81055/vdc_100095476461.0x00000c