3aA_MI-7Atomic Resolution Imaging and Analysis of 2D-materials at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun. (26th October 2018)

Record Type:: Journal Article
Title:: 3aA_MI-7Atomic Resolution Imaging and Analysis of 2D-materials at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun. (26th October 2018)
Main Title:: 3aA_MI-7Atomic Resolution Imaging and Analysis of 2D-materials at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun
Authors:: Hashiguchi, Hiroki
Sagawa, Ryusuke
Okunishi, Eiji
Endo, Noriaki
Kondo, Yukihito
Abstract:
Is Part Of:: Microscopy. Volume 67(2018)Supplement 2
Journal:: Microscopy
Issue:: Volume 67(2018)Supplement 2
Issue Display:: Volume 67, Issue 2 (2018)
Year:: 2018
Volume:: 67
Issue:: 2
Issue Sort Value:: 2018-0067-0002-0000
Page Start:: i28
Page End:: i28
Publication Date:: 2018-10-26
Subjects:: Microscopy -- Periodicals
502.825
Journal URLs:: http://jmicro.oxfordjournals.org/ ↗
http://ukcatalogue.oup.com/ ↗
DOI:: 10.1093/jmicro/dfy081 ↗
Languages:: English
ISSNs:: 2050-5698
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 12256.xml