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APA Citation
Hemmi, T., Nakayama, K., Asano, K., Miyazawa, T., & Tsuchida, H. (2014). cause of Forward Voltage Degradation for 4H-SiC PiN Diode with Additional Process. MRS proceedings, (1635), . http://access.bl.uk/ark:/81055/vdc_100089854186.0x00002d