Cite
MLA Citation
S Aldana et al.. “A 3D kinetic Monte Carlo simulation study of resistive switching processes in Ni/HfO2/Si-n+-based RRAMs.” Journal of physics, vol. 50, 2017, p. . http://access.bl.uk/ark:/81055/vdc_100087628564.0x00005b
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S Aldana et al.. “A 3D kinetic Monte Carlo simulation study of resistive switching processes in Ni/HfO2/Si-n+-based RRAMs.” Journal of physics, vol. 50, 2017, p. . http://access.bl.uk/ark:/81055/vdc_100087628564.0x00005b