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APA Citation
Liu, P., Lin, C., Hudec, B., & Hou, T. (2017). internal current amplification induced by dielectric hole trapping in monolayer MoS2 transistor. Nanotechnology, 28, . http://access.bl.uk/ark:/81055/vdc_100087553746.0x000041
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Liu, P., Lin, C., Hudec, B., & Hou, T. (2017). internal current amplification induced by dielectric hole trapping in monolayer MoS2 transistor. Nanotechnology, 28, . http://access.bl.uk/ark:/81055/vdc_100087553746.0x000041