Cite
HARVARD Citation
Liu, P. et al. (2017). Internal current amplification induced by dielectric hole trapping in monolayer MoS2 transistor. Nanotechnology. p. . [Online].
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Liu, P. et al. (2017). Internal current amplification induced by dielectric hole trapping in monolayer MoS2 transistor. Nanotechnology. p. . [Online].