Cite
APA Citation
Wang, J., Li, B., Huang, Y., Zhao, K., Yu, F., Zheng, Q., Guo, Q., Xu, L., Gao, J., Cai, X., & Cui, Y. (2018). the total ionizing dose response of leading-edge FDSOI MOSFETs. Microelectronics and reliability, 88, 979–983. http://access.bl.uk/ark:/81055/vdc_100069104503.0x00005f