The total ionizing dose response of leading-edge FDSOI MOSFETs. (September 2018)
- Record Type:
- Journal Article
- Title:
- The total ionizing dose response of leading-edge FDSOI MOSFETs. (September 2018)
- Main Title:
- The total ionizing dose response of leading-edge FDSOI MOSFETs
- Authors:
- Wang, J.
Li, B.
Huang, Y.
Zhao, K.
Yu, F.
Zheng, Q.
Guo, Q.
Xu, L.
Gao, J.
Cai, X.
Cui, Y. - Abstract:
- Abstract: In this paper, the total ionizing dose (TID) response of Ultra-Thin SOI (UTSOI) transistor is presented. TID experiments were performed on both NMOS and PMOS transistors under three different bias configurations (ON-state, OFF-state, TG-state). The results show that the OFF bias is relatively worse compared to other bias configurations for both NMOS and PMOS transistors. And the TID response variability caused by bias configuration during irradiation is small in UTSOI transistors. Besides this, the impact of back gate bias on TID response is also investigated. When a positive back bias is applied on NMOS transistor to achieve better performance, the threshold voltage degradation caused by TID becomes worse. While the negative back bias of PMOS transistor can lead to both better performance and higher TID tolerance. An explanation of back gate impact on front gate TID response is given with TCAD simulation. Highlights: TID responses of Ultra-Thin SOI transistors under different bias configurations during irradiation are investigated. The impact of back gate bias on TID response is discussed with TCAD simulation. A TID calibration law of the back bias is proposed for PMOS transistor.
- Is Part Of:
- Microelectronics and reliability. Volume 88/90(2018)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 88/90(2018)
- Issue Display:
- Volume 88/90, Issue 2018 (2018)
- Year:
- 2018
- Volume:
- 88/90
- Issue:
- 2018
- Issue Sort Value:
- 2018-NaN-2018-0000
- Page Start:
- 979
- Page End:
- 983
- Publication Date:
- 2018-09
- Subjects:
- FDSOI -- Ultra-thin SOI -- Back gate Bias -- TCAD simulation -- Total ionizing dose
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2018.07.080 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 10945.xml