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HARVARD Citation
Wang, J. et al. (2018). The total ionizing dose response of leading-edge FDSOI MOSFETs. Microelectronics and reliability. pp. 979-983. [Online].
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Wang, J. et al. (2018). The total ionizing dose response of leading-edge FDSOI MOSFETs. Microelectronics and reliability. pp. 979-983. [Online].