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APA Citation
Tajalli, A., Canato, E., Nardo, A., Meneghini, M., Stockman, A., Moens, P., Zanoni, E., & Meneghesso, G. (2018). impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors. Microelectronics and reliability, 88, 572–576. http://access.bl.uk/ark:/81055/vdc_100069046423.0x00005b