Cite
MLA Citation
C. Pennetta et al.. “A Percolative Approach to Reliability of Thin Film Interconnects and Ultra-thin Dielectrics.” VLSI design, vol. 13, no. 1, 2001, pp. 363–367. http://access.bl.uk/ark:/81055/vdc_100082136002.0x000048
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C. Pennetta et al.. “A Percolative Approach to Reliability of Thin Film Interconnects and Ultra-thin Dielectrics.” VLSI design, vol. 13, no. 1, 2001, pp. 363–367. http://access.bl.uk/ark:/81055/vdc_100082136002.0x000048